Kazuyoshi Torii, : rechercher sur Z-Library

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1

Ni-Salicided Poly-Si/poly-SiGe-Layered Gate Technology for 65-nm-node CMOSFETs

Muto, Akiyoshi, Ohji, Hiroshi, Maeda, Takeshi, Torii, Kazuyoshi, Kitajima, Hiroshi

Journal:

Japanese Journal of Applied Physics

Année:

2004

Langue:

english

Fichier:

PDF, 321 KB

english, 2004

2

Ultra-thin titanium oxide film with a rutile-type structure

Masahiko Hiratani, Masaru Kadoshima, Tatsumi Hirano, Yasuhiro Shimamoto, Yuichi Matsui, Toshihide Nabatame, Kazuyoshi Torii, Shinichiro Kimura

Journal:

Applied Surface Science

Année:

2003

Langue:

english

Fichier:

PDF, 210 KB

english, 2003

3

Reliability issues of silicon LSIs facing 100-nm technology node

Eiji Takeda, Eiichi Murakami, Kazuyoshi Torii, Yutaka Okuyama, Eishi Ebe, Kenji Hinode, Shin'ichiro Kimura

Journal:

Microelectronics Reliability

Année:

2002

Langue:

english

Fichier:

PDF, 634 KB

english, 2002

4

Widespread tephras in sediments from lake Ichi-no-Megata in northern Japan: Their description, correlation and significance

Mitsuru Okuno, Masayuki Torii, Kazuyoshi Yamada, Yoshitsugu Shinozuka, Tohru Danhara, Katsuya Gotanda, Hitoshi Yonenobu, Yoshinori Yasuda

Journal:

Quaternary International

Année:

2011

Langue:

english

Fichier:

PDF, 534 KB

english, 2011

5

Pt/TiN electrodes for stacked memory with polysilicon plug utilizing PZT films

Kushida-abdelghafar, Keiko, Hiratani, Masahiko, Torii, Kazuyoshi, Fujisaki, Yoshihisa

Journal:

Integrated Ferroelectrics

Année:

1996

Langue:

english

Fichier:

PDF, 648 KB

english, 1996

6

Size and top electrode-edge effects on fatigue in Pb(Zr,Ti)O 3 capacitors with Pt-electrodes

Torii, Kazuyoshi, Colla, Enrico L., Song, H. W., Tagantsev, Alexander K., No, Kwangsoo, Setter, Nava.

Journal:

Integrated Ferroelectrics

Année:

2001

Langue:

english

Fichier:

PDF, 768 KB

english, 2001

7

Texture control of Pb(Zr, Ti)O 3 thin films

Torii, Kazuyoshi, Matsui, Yuichi, Fujisaki, Yoshihisa

Journal:

Integrated Ferroelectrics

Année:

1999

Langue:

english

Fichier:

PDF, 667 KB

english, 1999

8

Dielectric breakdown Characteristics of poly-Si/HfAlOx/SiON gate stack

Torii, Kazuyoshi, Ohji, Hiroshi, Mutoh, Akiyoshi, Kawahara, Takaaki, Mitsuhashi, Riichiro, Horiuchi, Atsushi, Miyazaki, S., Kitajima, Hiroshi

Journal:

MRS Proceedings

Année:

2004

Langue:

english

Fichier:

PDF, 617 KB

english, 2004

9

Fabrication and properties of one-mask-patterned ferroelectric integrated capacitors

Kazuyoshi Torii, Kenichi Shoji, Hiroshi Kawakami, Takao Kumihashi, Toshihiko Itoga, Natsuki Yokoyama, Masahiro Moniwa, Tooru Kaga, Yoshihisa Fujisaki

Journal:

Electrical Engineering in Japan

Année:

1997

Fichier:

PDF, 981 KB

1997

10

A convenient synthesis of S-glycosyl donors of sialic acid and their use for O-glycosylation

Kazuyoshi Takeda, Kanoko Tsuboyama, Katsumi Torii, Kimio Furuhata, Noriko Sato, Haruo Ogura

Journal:

Carbohydrate Research

Année:

1990

Langue:

english

Fichier:

PDF, 503 KB

english, 1990

11

Oxygen-vacancy-induced threshold voltage shifts in Hf-related high-k gate stacks

Kenji Shiraishi, Keisaku Yamada, Kazuyoshi Torii, Yasushi Akasaka, Kiyomi Nakajima, Mitsuru Konno, Toyohiro Chikyow, Hiroshi Kitajima, Tsunetoshi Arikado, Yasuo Nara

Journal:

Thin Solid Films

Année:

2006

Langue:

english

Fichier:

PDF, 251 KB

english, 2006

12

Single-step preparation of allylic sulfides having 1-phenyltetrazole-5-thio group from allylic alcohols using S,S′-BIS(1-phenyl-1H-tetrazol-5-YL) dithiocarbonate and reactions involving the allylic sulfides

Kazuyoshi Takeda, Kanoko Tsuboyama, Katsumi Torii, Maki Murata, Haruo Ogura

Journal:

Tetrahedron Letters

Année:

1988

Langue:

english

Fichier:

PDF, 293 KB

english, 1988

13

Built-in interface in high-κ gate stacks

Masahiko Hiratani, Kazuyoshi Torii, Yasuhiro Shimamoto, Shin-Ichi Saito

Journal:

Applied Surface Science

Année:

2003

Langue:

english

Fichier:

PDF, 182 KB

english, 2003

14

Analysis and control of surface degenerated layers grown on thin Pb(Zr, Ti)O3 films

Yoshihisa Fujisaki, Kazuyoshi Torii, Masahiko Hiratani, Keiko Kushida-Abdelghafar

Journal:

Applied Surface Science

Année:

1997

Langue:

english

Fichier:

PDF, 234 KB

english, 1997

15

MHC class I Aloci polymorphism and diversity in three Southeast Asian populations of cynomolgus macaque

Yuki F. Kita, Kazuyoshi Hosomichi, Sakae Kohara, Yasushi Itoh, Kazumasa Ogasawara, Hideaki Tsuchiya, Ryuzo Torii, Hidetoshi Inoko, Antoine Blancher, Jerzy K. Kulski, Takashi Shiina

Journal:

Année:

2009

Langue:

english

Fichier:

PDF, 377 KB

english, 2009

16

Silver triflate-promoted coupling reactions of benzylic and allylic sulfides with O-silylated enolates of ketones and esters, a synthesis of (±)-ar-turmerone

Kazuyoshi Takeda, Katsumi Torii, Haruo Ogura

Journal:

Tetrahedron Letters

Année:

1990

Langue:

english

Fichier:

PDF, 138 KB

english, 1990

17

Rutile-type TiO2 thin film for high-k gate insulator

Masaru Kadoshima, Masahiko Hiratani, Yasuhiro Shimamoto, Kazuyoshi Torii, Hiroshi Miki, Shinichiro Kimura, Toshihide Nabatame

Journal:

Thin Solid Films

Année:

2003

Langue:

english

Fichier:

PDF, 402 KB

english, 2003

18

Effect of interfacial oxide on electron mobility in metal insulator semiconductor field effect transistors with Al2O3 gate dielectrics

Kazuyoshi Torii, Yasuhiro Shimamoto, Shin-ichi Saito, Katsunori Obata, Tsuyoshi Yamauchi, Digh Hisamoto, Takahiro Onai, Masahiko Hiratani

Journal:

Microelectronic Engineering

Année:

2003

Langue:

english

Fichier:

PDF, 147 KB

english, 2003

19

A BAC-based contig map of the cynomolgus macaque (Macaca fascicularis) major histocompatibility complex genomic region

Atsushi Watanabe, Takashi Shiina, Sayoko Shimizu, Kazuyoshi Hosomichi, Kazuyo Yanagiya, Yuki F. Kita, Tetsuaki Kimura, Eiichi Soeda, Ryuzo Torii, Kazumasa Ogasawara, Jerzy K. Kulski, Hidetoshi Inoko

Journal:

Année:

2007

Langue:

english

Fichier:

PDF, 972 KB

english, 2007

20

Electrode‐induced degradation of Pb(ZrxTi1-x)O3 (PZT) polarization hysteresis characteristics in Pt/PZT/Pt ferroelectric thin‐film capacitors

Kushida‐Abdelghafar, Keiko, Miki, Hiroshi, Torii, Kazuyoshi, Fujisaki, Yoshihisa

Journal:

Applied Physics Letters

Année:

1996

Langue:

english

Fichier:

PDF, 395 KB

english, 1996

21

Oxide TFT Rectifier Achieving 13.56-MHz Wireless Operation

Kawamura, Tetsufumi, Wakana, Hironori, Fujii, Kuniharu, Ozaki, Hiroaki, Watanabe, Kazuki, Yamazoe, Takanori, Uchiyama, Hiroyuki, Torii, Kazuyoshi

Journal:

IEEE Transactions on Electron Devices

Année:

2012

Langue:

english

Fichier:

PDF, 524 KB

english, 2012

22

[IEEE 2008 IEEE International Reliability Physics Symposium (IRPS) - Phoenix, AZ, USA (2008.04.27-2008.05.1)] 2008 IEEE International Reliability Physics Symposium - Electron trapping characteristics and scalability of HfO2 as a trapping layer in SONOS-type flash memories

Hirotaka Hamamura,, Takeshi Ishida,, Toshiyuki Mine,, Yutaka Okuyama,, Digh Hisamoto,, Yasuhiro Shimamoto,, Shin'ichiro Kimura,, Kazuyoshi Torii,

Année:

2008

Langue:

english

Fichier:

PDF, 403 KB

english, 2008

23

Characterization of Neutron Beams for Boron Neutron Capture Therapy: In-Air Radiobiological Dosimetry

Tetsuya Yamamoto, Akira Matsumura, Kazuyoshi Yamamoto, Hiroaki Kumada, Naohiko Hori, Yoshiya Torii, Yasushi Shibata and Tadao Nose

Journal:

Radiation Research

Année:

2003

Langue:

english

Fichier:

PDF, 1.43 MB

english, 2003

24

Characterization of Neutron Beams for Boron Neutron Capture Therapy: In-Air Radiobiological Dosimetry

Yamamoto, Tetsuya, Matsumura, Akira, Yamamoto, Kazuyoshi, Kumada, Hiroaki, Hori, Naohiko, Torii, Yoshiya, Shibata, Yasushi, Nose, Tadao

Journal:

Radiation Research

Année:

2003

Langue:

english

Fichier:

PDF, 425 KB

english, 2003

25

[IEEE 2008 IEEE International Reliability Physics Symposium (IRPS) - Phoenix, AZ, USA (2008.04.27-2008.05.1)] 2008 IEEE International Reliability Physics Symposium - Impact of threshold voltage fluctuation due to random telegraph noise on scaled-down SRAM

Naoki Tega,, Hiroshi Miki,, Masanao Yamaoka,, Hitoshi Kume,, Toshiyuki Mine,, Takeshi Ishida,, Yuki Mori,, Renichi Yamada,, Kazuyoshi Torii,

Année:

2008

Langue:

english

Fichier:

PDF, 702 KB

english, 2008

26

[IEEE 2012 IEEE Silicon Nanoelectronics Workshop (SNW) - Honolulu, HI, USA (2012.06.10-2012.06.11)] 2012 IEEE Silicon Nanoelectronics Workshop (SNW) - New type steep-S device using the bipolar action

Hisamoto, Digh, Saito, Shin-ichi, Shima, Akio, Yoshimoto, Hiroyuki, Torii, Kazuyoshi

Année:

2012

Langue:

english

Fichier:

PDF, 215 KB

english, 2012

27

[IEEE 2008 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2008.12.15-2008.12.17)] 2008 IEEE International Electron Devices Meeting - Comprehensive study on vth variability in silicon on Thin BOX (SOTB) CMOS with small random-dopant fluctuation: Finding a way to further reduce variation

Nobuyuki Sugii,, Ryuta Tsuchiya,, Takashi Ishigaki,, Yusuke Morita,, Hiroyuki Yoshimoto,, Kazuyoshi Torii,, Shin'ichiro Kimura,

Année:

2008

Langue:

english

Fichier:

PDF, 809 KB

english, 2008

28

[IEEE 2010 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2010.12.6-2010.12.8)] 2010 International Electron Devices Meeting - CxFET: A novel steep subthreshold swing CMOS featuring a tunnel-injection bipolar transistor and MOSFET device complex

Hisamoto, Digh, Saito, Shin-ichi, Shima, Akio, Yoshimoto, Hiroyuki, Torii, Kazuyoshi, Takeda, Eiji

Année:

2010

Langue:

english

Fichier:

PDF, 241 KB

english, 2010

29

[IEEE 2006 IEEE International Reliability Physics Symposium Proceedings - San Jose, CA, USA (2006.03.26-2006.03.30)] 2006 IEEE International Reliability Physics Symposium Proceedings - Determination of Time to Breakdown of 0.8-1.2 nm EOT HfSiON Gate Dielectrics with Poly-Si and Metal Gate Electrodes

Inumiya, Seiji, Torii, Kazuyoshi, Nara, Yasuo

Année:

2006

Langue:

english

Fichier:

PDF, 293 KB

english, 2006

30

Isotopic labeling study of the oxygen diffusion in HfO[sub 2]∕SiO[sub 2]∕Si

Zhao, Ming, Nakajima, Kaoru, Suzuki, Motofumi, Kimura, Kenji, Uematsu, Masashi, Torii, Kazuyoshi, Kamiyama, Satoshi, Nara, Yasuo, Watanabe, Heiji, Shiraishi, Kenji, Chikyow, Toyohiro, Yamada, Keisaku

Journal:

Applied Physics Letters

Année:

2007

Langue:

english

Fichier:

PDF, 333 KB

english, 2007

31

Silicon light-emitting transistor for on-chip optical interconnection

Saito, Shin-ichi, Hisamoto, Digh, Shimizu, Haruka, Hamamura, Hirotaka, Tsuchiya, Ryuta, Matsui, Yuichi, Mine, Toshiyuki, Arai, Tadashi, Sugii, Nobuyuki, Torii, Kazuyoshi, Kimura, Shin’ichiro, Onai, Ta

Journal:

Applied Physics Letters

Année:

2006

Langue:

english

Fichier:

PDF, 947 KB

english, 2006

32

Remote-charge-scattering limited mobility in field-effect transistors with SiO[sub 2] and Al[sub 2]O[sub 3]∕SiO[sub 2] gate stacks

Saito, Shin-ichi, Torii, Kazuyoshi, Shimamoto, Yasuhiro, Tonomura, Osamu, Hisamoto, Digh, Onai, Takahiro, Hiratani, Masahiko, Kimura, Shin’ichiro, Manabe, Yukiko, Caymax, Matty, Maes, Jan Willem

Journal:

Journal of Applied Physics

Année:

2005

Langue:

english

Fichier:

PDF, 1.25 MB

english, 2005

33

Pt/PbZr[sub x]Ti[sub 1−x]O[sub 3] interfacial reaction and Schottky barrier formation studied by x-ray photoelectron spectroscopy: Effect of H[sub 2] and O[sub 2] annealing

Takatani, Shinichiro, Miki, Hiroshi, Kushida-Abdelghafar, Keiko, Torii, Kazuyoshi

Journal:

Journal of Applied Physics

Année:

1999

Langue:

english

Fichier:

PDF, 514 KB

english, 1999

34

Improved theory for remote-charge-scattering-limited mobility in metal–oxide–semiconductor transistors

Saito, Shin-ichi, Torii, Kazuyoshi, Hiratani, Masahiko, Onai, Takahiro

Journal:

Applied Physics Letters

Année:

2002

Langue:

english

Fichier:

PDF, 256 KB

english, 2002

35

Effects of remote-surface-roughness scattering on carrier mobility in field-effect-transistors with ultrathin gate dielectrics

Saito, Shin-ichi, Torii, Kazuyoshi, Shimamoto, Yasuhiro, Tsujikawa, Shimpei, Hamamura, Hirotaka, Tonomura, Osamu, Mine, Toshiyuki, Hisamoto, Digh, Onai, Takahiro, Yugami, Jiro, Hiratani, Masahiko, Kim

Journal:

Applied Physics Letters

Année:

2004

Langue:

english

Fichier:

PDF, 452 KB

english, 2004

36

[IEEE 2010 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2010.12.6-2010.12.8)] 2010 International Electron Devices Meeting - Hysteretic drain-current behavior due to random telegraph noise in Scaled-down FETs with high-κ/metal-gate stacks

Miki, Hiroshi, Tega, Naoki, Ren, Zhibin, D'Emic, Christopher P., Zhu, Yu, Frank, David J., Guillorn, Michael A., Park, Dae-Gyu, Haensch, Wilfried, Torii, Kazuyoshi

Année:

2010

Langue:

english

Fichier:

PDF, 679 KB

english, 2010

37

[IEEE 2011 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2011.04.10-2011.04.14)] 2011 International Reliability Physics Symposium - Impact of HK / MG stacks and future device scaling on RTN

Tega, Naoki, Miki, Hiroshi, Ren, Zhibin, D'Emic, Christoper P., Zhu, Yu, Frank, David J., Guillorn, Michael A., Park, Dae-Gyu, Haensch, Wilfried, Torii, Kazuyoshi

Année:

2011

Langue:

english

Fichier:

PDF, 1.47 MB

english, 2011

38

[IEEE 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings - Shanghai, China (2006.10.23-2006.10.26)] 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings - Oxidation process of HfO/sub 2//SiO/sub 2//Si structures observed by high-resolution RBS

Ming, Zhao, Nakajima, Kaoru, Suzuki, Motofumi, Kimura, Kenji, Uematsu, Masashi, Torii, Kazuyoshi, Kamiyama, Satoshi, Nara, Yasuo, Watanabe, Heiji, Shiraishi, Kenji, Chikyow, Toyohiro, Yamada, Keisaku

Année:

2006

Langue:

english

Fichier:

PDF, 131 KB

english, 2006

39

[IEEE 2007 IEEE/RSJ International Conference on Intelligent Robots and Systems - San Diego, CA, USA (2007.10.29-2007.11.2)] 2007 IEEE/RSJ International Conference on Intelligent Robots and Systems - A biped robot that keeps steps in time with musical beats while listening to music with its own ears

Yoshii, Kazuyoshi, Nakadai, Kazuhiro, Torii, Toyotaka, Hasegawa, Yuji, Tsujino, Hiroshi, Komatani, Kazunori, Ogata, Tetsuya, Okuno, Hiroshi G.

Année:

2007

Langue:

english

Fichier:

PDF, 389 KB

english, 2007

40

[ECS 215th ECS Meeting - San Francisco, CA (May 24 - May 29, 2009)] ECS Transactions - Band Engineering of Rutile TiO2 by Cobalt Doping in Ru/Rutile-TiO2/Ru Capacitor aiming 40-nm DRAM and Beyond

Tonomura, Osamu, Sekiguchi, Tomoko, Inada, Naomi, Hamada, Tomoyuki, Miki, Hiroshi, Torii, Kazuyoshi

Année:

2009

Langue:

english

Fichier:

PDF, 976 KB

english, 2009

41

Selective Dry Etching of HfO 2 in CF 4 and Cl 2 /HBr-Based Chemistries

Maeda, Takeshi, Ito, Hiroyuki, Mitsuhashi, Riichiro, Horiuchi, Atsushi, Kawahara, Takaaki, Muto, Akiyoshi, Sasaki, Takaoki, Torii, Kazuyoshi, Kitajima, Hiroshi

Journal:

Japanese Journal of Applied Physics

Année:

2004

Langue:

english

Fichier:

PDF, 119 KB

english, 2004

42

Point defects in thin HfAlOx films probed by monoenergetic positron beams

Uedono, Akira, Mitsuhashi, Riichiro, Horiuchi, Atsushi, Torii, Kazuyoshi, Yamabe, Kikuo, Yamada, Keisaku, Suzuki, Ryouichi, Ohdaira, Toshiyuki, Mikado, Tomohisa

Journal:

MRS Proceedings

Année:

2003

Langue:

english

Fichier:

PDF, 118 KB

english, 2003

43

Role of ozone in reactive coevaporation of lead zirconate titanate thin films

Torii, Kazuyoshi, Yano, Fumiko, Fujisaki, Yoshihisa

Journal:

Journal of Materials Research

Année:

1998

Langue:

english

Fichier:

PDF, 545 KB

english, 1998

44

[ECS 208th ECS Meeting - Los Angeles, California (October 16-October 21, 2005)] ECS Transactions - Theoretical Studies on the Physical Properties of Poly-Si and Metal Gates/HfO2 Related High-k Dielectrics Interfaces

Shiraishi, Kenji, Torii, Kazuyoshi, Akasaka, Yasushi, Nakayama, Takashi, Nakaoka, Takashi, Miyazaki, Seiichi, Chikyow, Toyohiro, Yamada, Keisaku, Nara, Yasuo

Année:

2006

Langue:

english

Fichier:

PDF, 442 KB

english, 2006

45

Domain Wall Displacement Detection Magnetooptical Drive for Mobile Use, with 15 Gbit/inch 2 Recording Density and 24 Mbps Data Transfer Rate

Nagura, Chihiro, Torii, Shinnosuke, Ishii, Kazuyoshi, Nagatsuka, Osamu, Nishikawa, Koichiro, Miyaoka, Yasuyuki, Suzuki, Kazunori, Koyama, Osamu

Journal:

Japanese Journal of Applied Physics

Année:

2004

Langue:

english

Fichier:

PDF, 235 KB

english, 2004

46

High-Quality CVD SiO[sub 2] Interfacial Layer Prepared by Cyclic Deposition with O[sub 2] Plasma Treatment

Hamamura, Hirotaka, Matsumura, Mieko, Mine, Toshiyuki, Torii, Kazuyoshi

Journal:

Journal of The Electrochemical Society

Année:

2006

Langue:

english

Fichier:

PDF, 145 KB

english, 2006

47

Band Engineering of Ru∕Rutile-TiO2∕Ru Capacitors by Doping Cobalt to Suppress Leakage Current

Tonomura, Osamu, Sekiguchi, Tomoko, Inada, Naomi, Hamada, Tomoyuki, Miki, Hiroshi, Torii, Kazuyoshi

Journal:

Journal of The Electrochemical Society

Année:

2012

Langue:

english

Fichier:

PDF, 331 KB

english, 2012

48

Reduction of CV Hysteresis in Metal/High-k MISFETs Using Flash Lamp Post Deposition Annealing

Matsuki, Takeo, Akasaka, Yasushi, Hayashi, Kiyoshi, Noguchi, Masataka, Yamashita, Koji, Syoji, Hideyuki, Torii, Kazuyoshi, Kasai, Naoki, Arikado, Tsunetoshi

Journal:

MRS Proceedings

Année:

2004

Langue:

english

Fichier:

PDF, 104 KB

english, 2004

49

State Transition of a Defect Causing Random-Telegraph-Noise Fluctuation in Stress-Induced Leakage Current of Thin SiO 2 Films in a Metal–Oxide–Silicon Structure

Ishida, Takeshi, Tega, Naoki, Mori, Yuki, Miki, Hiroshi, Mine, Toshiyuki, Kume, Hitoshi, Torii, Kazuyoshi, Yamada, Ren-ichi, Shiraishi, Kenji

Journal:

Japanese Journal of Applied Physics

Année:

2013

Langue:

english

Fichier:

PDF, 794 KB

english, 2013

50

Nitrided Hafnium Silicate Film Formation by Sequential Process Using a Hot Wall Batch System and Its Application to MOS Transistor

Aoyama, Tomonori, Torii, Kazuyoshi, Mitsuhashi, Riichirou, Maeda, Takeshi, Kamiyama, Satoshi, Horiuchi, Atsushi, Kitajima, Hiroshi, Arikado, Tsunetoshi

Journal:

MRS Proceedings

Année:

2003

Langue:

english

Fichier:

PDF, 973 KB

english, 2003